WeaveTM is a 2D and 3D SEM Image Analysis Tool for Critical Dimension Extraction

Enables critical dimension measurements for unique structures, Increases imaging throughput and removes human bias and increases accuracy of critical dimension measurements

Developed in partnership with

NIST logo

WeaveTM accelerates SEM image analysis by allowing engineers to automate the extraction of user-defined critical dimension measurements. Manually analyzing tens of thousands of SEM images is expensive and time consuming. WeaveTM automates image-analysis, reducing the metrology cost by 50% and allowing users to focus on development.

Plug and Play with SandBox Studio

WeaveTM interfaces directly with SandboxTM Studio, enabling engineers to quickly catalog image data and harness advance computing and visualization capabilities.

SandBox Studio Weave Integration


Automation of process metrology will reduce user subjectivity and increase accuracy of wafer testing and enable the creation of standardized databases. Weave will enable curated image databases, facilitating data integration across fabrication facilities.

Weave - User-defined critical dimension metrology criteria
Weave - Automation of critical dimension extraction from images
SandBox Studio Bundle